Aeroflex 2948B Betriebsanleitung Seite 90

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LOCAL OPERATION
3-36
*DUPLEX*
All of the above information relating to modulation characteristics and frequency response testing
also applies to tests made using the Dx TEST mode. The oscilloscope facility is not available
when in Dx TEST mode.
Modulation distortion
C1640
dBdB
dB dB
kHzkHz
kHz kHz
a
cd
b
FrequencyFrequency
Frequency Frequency
11
1 1
Filter Response
Noise
Noise Noise
Distortion Products
Distortion Products
Signal
Filter Response
Fig. 3-10 Distortion level and signal to noise level measurements
The signal containing the information being communicated will become distorted during its
progress through the system. This distortion may be very slight and almost unnoticeable to the ear
or it may be so severe as to cause the information to become unintelligible.
The reasons for this distortion to the signal are the non-linearity of the amplifiers and modulators
in the system, and noise within the circuits becoming attached to the signal.
By applying a sinewave signal of known purity to the input of the system and measuring the
distortion and noise levels of the demodulated signal obtained at the output of the system,
evaluation of the quality of the transmitter is possible.
The three measurements used for this evaluation are SINAD level; distortion percentage; and
signal to noise ratio.
The procedures described below are carried out repeatedly under the instruction of the Service
Monitor software and the displayed results are continually updated.
To obtain the SINAD level of a signal at the output of a transmitter the output level is measured
and noted.
The signal measured consists of the value of the fundamental signal, the values of any distortion
products generated and the value of any noise present.
A notch filter tuned to the frequency of the input signal is then placed in the output signal path and
the level again measured and noted. The second measurement consists only of the values of any
distortion products generated and the value of any noise present. See page 3-36, Fig. 3-10 a, b, &
c, Distortion level and signal to noise level measurements.
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